Effect of La substitution on the microstructure and dielectric properties of the sol-gel derived BaZr0.2Ti0.8O3 thin films

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dc.authorid0000-0002-6577-3632en_US
dc.authorid0000-0002-4234-0228en_US
dc.contributor.authorMahmood, Asad
dc.contributor.authorMensur-Alkoy, Ebru
dc.contributor.authorNaeem, Abdul
dc.contributor.authorIqbal, Yaseen
dc.contributor.authorUllah, Asad
dc.contributor.authorAlkoy, Sedat
dc.date.accessioned2024-07-12T21:53:30Z
dc.date.available2024-07-12T21:53:30Z
dc.date.issued2016en_US
dc.departmentMaltepe Üniversitesien_US
dc.description.abstractA-site deficient Ba1-xLa2x/3(Zr0.2Ti0.8)O-3 (BLZT) thin films with x = 0.00, 0.004, 0.006, 0.008, 0.02, 0.06 were processed using a sol-gel technique. X-ray diffraction analysis was used to investigate phase evolution of BLZT films with temperature. Scanning electron microscopy and atomic force microscopy were used to investigate the microstructure and surface topography of the fabricated BLZT thin films. The samples with x = 0.00-0.008 showed a homogeneous grain size distribution and uniform surface morphology; however, a certain degree of agglomeration was observed for the samples with x > 0.008 which increased with increasing La content. The magnitude of root mean square for the samples with x = 0.00, 0.004, 0.006, 0.008, 0.02 and 0.06 was recorded to be 3.53 nm, 3.06 nm, 2.32 nm, 2.02 nm, 3.36 nm and 4.71 nm, respectively. Relative permittivity (epsilon(r)) was observed to decrease with increasing temperature, and increased non-linearly with an increase in La content. Dielectric dispersion was observed for all the BLZT samples and er decreased with increasing frequency. (C) 2016 Elsevier B.V. All rights reserved.en_US
dc.description.sponsorshipScientific and Technological Research Council of Turkey (TUBITAK) under the 2216-Fellowship Program for International Studentsen_US
dc.description.sponsorshipThe authors acknowledge the financial support by the Scientific and Technological Research Council of Turkey (TUBITAK) under the 2216-Fellowship Program for International Students.en_US
dc.identifier.doi10.1016/j.tsf.2016.05.008
dc.identifier.endpage73en_US
dc.identifier.issn0040-6090
dc.identifier.scopus2-s2.0-84971212625en_US
dc.identifier.scopusqualityQ2en_US
dc.identifier.startpage68en_US
dc.identifier.urihttps://dx.doi.org/10.1016/j.tsf.2016.05.008
dc.identifier.urihttps://hdl.handle.net/20.500.12415/8511
dc.identifier.volume611en_US
dc.identifier.wosWOS:000377933200012en_US
dc.identifier.wosqualityQ2en_US
dc.indekslendigikaynakWeb of Science
dc.indekslendigikaynakScopus
dc.language.isoenen_US
dc.publisherELSEVIER SCIENCE SAen_US
dc.relation.ispartofTHIN SOLID FILMSen_US
dc.relation.publicationcategoryMakale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanıen_US
dc.rightsinfo:eu-repo/semantics/closedAccessen_US
dc.snmzKY03588
dc.subjectSol-gelen_US
dc.subjectX-ray diffractionen_US
dc.subjectMicrostructureen_US
dc.subjectDielectric constanten_US
dc.subjectBarium zirconate titanateen_US
dc.titleEffect of La substitution on the microstructure and dielectric properties of the sol-gel derived BaZr0.2Ti0.8O3 thin filmsen_US
dc.typeArticle
dspace.entity.typePublication

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